Xavier Galiano

 PhD, UPMC Univ Paris 06
 
Former activity at GeePs:

Working on a research project about innovative semiconductor bolometric pixel arrays for active terahertz imaging funded by UPMC Univ Paris 06

Background:

Assistant Engineer at InESS, Strasbourg, France – 3 month long internship, 2011
Assistant Engineer at On Semiconductor, Belgium – 6 month long internship, 2012
Engineer and Master Degree, Telecom Physique Strasbourg and Strasbourg University, France, 2012

PhD subject:

Semiconducting YBaCuO uncooled thermal detectors for infrared and terahertz imaging  (PhD supervisor: A. Dégardin); UPMC doctoral school grant (2012-2015); ATER position at UPMC (2015-2016); Defended on 13 Sept. 2016
Keywords: Amorphous semiconductors. Thin films. IR and Far-IR /THz radiation detectors. Electrical and optical instrumentation.

Some recent publications:

1. A.J. Kreisler, A.F. Dégardin, X. Galiano & D. Alamargui, “Low noise and fast response of IR sensing structures based on amorphous Y-Ba-Cu-O semiconducting thin films sputtered on silicon,” Thin Solid Film 617, pp. 71-75 (2016).

2. A.F. Dégardin, V.S. Jagtap, X. Galiano & A.J. Kreisler, “Semiconducting Y-Ba-Cu-O thin films sputtered on MgO and SiOx/Si substrates: Morphological, electrical and optical properties for infrared sensing applications,” Thin Solid Films 601, pp. 93-98 (2016).

3. X. Galiano, A.F. Dégardin, V.S. Jagtap & A.J. Kreisler, “Fast pyroelectric response of semiconducting Y-Ba-Cu-O detectors with high IR sensitivity,” IRMMW-THz 2015, IEEE Proc. DOI: 10.1109/IRMMW-THz.2015.7327488

4. A.F. Dégardin, X. Galiano, A. Gensbittel, O. Dubrunfaut, V.S. Jagtap & A.J. Kreisler, "Amorphous Y–Ba–Cu–O oxide thin films: Structural, electrical and dielectric properties correlated with uncooled infrared pyroelectric detection performances," Thin Solid Films 553, pp. 104-108 (2014).

5. X. Galiano, A.J. Kreisler, V.S. Jagtap & A.F. Dégardin, “Semiconducting Y-Ba-Cu-O thermal detectors: Low noise and fast pyroelectric IR response; development for future THz imagers,” IRMMW-THz 2013 - IEEE Proc. DOI 10.1109/IRMMW-THz.2013.6665745

Some recent presentations:

1. X. Galiano, A.F. Dégardin, V.S. Jagtap & A.J. Kreisler, “Fast pyroelectric response of semiconducting Y-Ba-Cu-O detectors with high IR sensitivity,” International Conference on Infrared, Millimeter and THz Waves (IRMMW-THz 2015), Hong Kong (23-28 August 2015), Oral presentation # H1D-2.

2. X. Galiano, D. Alamarguy, K. Khandelwal, V.S. Jagtap, A.F. Dégardin & A.J. Kreisler, “Semiconducting Y-Ba-Cu-O thin films deposited on various substrates: morphological, compositional, electrical and optical properties for infrared sensors,” Conf. of the European Materials Science Society (E-MRS 2015), Lille, France (11-15 May 2015), Poster #N PII-29.

3. A.J. Kreisler, X. Galiano, V.S. Jagtap, D. Alamarguy & A.F. Dégardin “Low noise and fast response of IR sensing structures based on amorphous Y-Ba-Cu-O semiconducting thin films sputtered on silicon,” Conf. of the European Materials Science Society (E-MRS 2015), Lille, France (11-15 May 2015), Oral presentation #M VIII-5.

4. X. Galiano, A.F. Dégardin & A.J. Kreisler, “Pyroelectric sensing with Y-Ba-Cu-O amorphous semiconductor: infrared performance and THz potentials”, European Materials Science Society – Fall Meeting 2014 (E-MRS 2014) Varsovie, Pologne (15-19 September 2014), Oral presentation #Q-13.

5. X. Galiano, A. Kreisler, V. Jagtap & A. Dégardin, “Détecteurs thermiques en Y-Ba-Cu-O semiconducteur : réponse rapide et faible bruit en infrarouge – développement de futurs dispositifs THz,” 13èmes Journées de Caractérisation Micro-ondes et Matériaux (JCMM 2014), Nantes (24 – 26 mars 2014), présentation orale.

6. X. Galiano, A.J. Kreisler, V.S. Jagtap & A.F. Dégardin, “Semiconducting Y-Ba-Cu-O thermal detectors: Low noise and fast pyroelectric IR response; development for future THz imagers,” International Conference on Infrared, Millimeter and THz Waves (IRMMW-THz 2013), Invited oral presentation #WE4-1, Mainz, Allemagne (1-6 September 2013).

7. A.J. Kreisler, X. Galiano, V.S. Jagtap & A.F. Dégardin, “Amorphous Y-Ba-Cu-O oxide thin films grown on silicon substrates: optical properties and infrared sensor characterization for future THz imagers,” Conference of the European Materials Science Society (E-MRS 2013), Strasbourg, France (27-31 May 2013), Oral presentation #O XIII.