Professor Emeritus at Sorbonne Université
 alain.kreisler(at)centralesupelec.fr
 Phone: +33 1 69 85 16 51
Present activity at GeePs:

Head of the “IR/THz detection and imaging” theme within the IDI Team
Formerly research coordinator of the EU NANOTIME project (2005-2009)
Formerly task leader within the MASTHER ANR project (Miniaturized All-Solid state Terahertz HEterodyne Receiver; 2011-2015)

Background:

Graduated Supélec, Engineering institute in Energy and Information Science (1963)
Researcher at CNRS (French National Center for Scientific Research (1966)
PhD Thesis in Solid State Electronics, UPMC Univ Paris 06 (1973)
Post Doc at Sussex University – UK (1974) – Materials Science Laboratory
Full Professor at UPMC Univ Paris 06 and Supélec (1988-2007); taught Digital and Analog electronics, Sensor physics, Materials science, Microelectronics, Electromagnetics
Activity at the French Ministry of Research (1993-1997). Head of LGEP (2000-2005)

Research interests:

Early research topics: Instrumentation engineering for Terrestrial sciences; Solid state electronics (Magnetic resonance in complex alloys); Metallurgical Sciences
Head of “Submillimeter Wave Research” Group (1980-1990) at Paris 6 University; developed terahertz laser sources and Schottky diode detectors and mixers up to 10 THz
Head of “Superconducting Thin Films and Devices” Group (1990-2003) at LGEP; developed high-Tc film technologies for: microwave passive devices, mid-IR and Terahertz radiation bolometric detectors
Head of “Materials and Devices: from Microwaves to the Infrared” MDMI Team (2003-2007)
Currently developing THz imaging (cooled and uncooled) arrays

Some recent publications:

1. R. Ladret, A. Dégardin, V. Jagtap, and A. Kreisler, "THz Mixing with High-TC Hot Electron Bolometers: a Performance Modeling Assessment for Y-Ba-Cu-O Devices," Photonics 6(7), 26 pages (2019). doi:10.3390/photonics6010007

2.  A. J. Kreisler, X. Galiano, V. S. Jagtap, M. Razanoelina, M. Tonouchi, and A. F. Dégardin, “Amorphous YBaCuO pyroelectric NIR detectors: ready to proceed through the THz gap?,” Joint Symposium of the 4th International Symposium on Microwave/THz Science and Applications (MTSA 2017) and the 6th International Symposium on Terahertz Nanoscience (TeraNano-6), Okayama, Japan (19 – 23 November 2017), Invited oral presentation #B2-1 

3. A.J. Kreisler, A.F. Dégardin, X. Galiano & D. Alamarguy, “Low noise and fast response of IR sensing structures based on amorphous Y-Ba-Cu-O semiconducting thin films sputtered on silicon,” Thin Solid Films 617, pp. 71-75 (2016).

4. R. Ladret, A.J. Kreisler & A.F. Dégardin, “YBCO-Constriction Hot Spot Modeling: DC and RF Descriptions for HEB THz Mixer Noise Temperature and Conversion Gain,” IEEE Trans. Appl. Supercond. 25 (3), p. 2300505 (2015).  

5. A. J. Kreisler, I. Türer, X. Gaztelu & A. F. Dégardin, “UWB Antennas for CW Terahertz Imaging: Cross Talk Issues,” Ultra-Wideband, Short-Pulse Electromagnetics 10, F. Sabath and E.L. Mokole Eds., Springer, Chap. 43, pp. 473-482 (2014).

6. A. J. Kreisler, V. S. Jagtap and A. F. Dégardin, “Infrared response in the 95 to 300 K range of detectors based on oxygen-depleted Y-Ba-Cu-O thin films,” Physics Procedia 36, pp. 223-228 (2012).

7. V. S. Jagtap, A. F. Dégardin, and A. J. Kreisler, “Low temperature amorphous growth of semi-conducting Y-Ba-Cu-O oxide thin films in view of infrared bolometric detection,” Thin Solid Films 520, pp. 4754-4757 (2012).

8. A. Kreisler, I. Türer, X. Gaztelu, A. Scheuring and A. Dégardin, “Terahertz broadband micro-antennas for continuous wave imaging,” in Non-Standard Antennas, F. Le Chevalier et al. Eds, WILEY-ISTE, pp. 117-145 (2011).

9. M. Aurino, A. Martinez, I. Türer, V. S. Jagtap, A. Gensbittel, A. F. Dégardin and A. J. Kreisler, “Ageing and embedding issues for high-Tc superconducting hot-electron bolometers for THz imaging,” SPIE Proc. 7671, M. Anwar et al. Eds, 767103-1/10 (2010).

10. V. Michal, G. Klisnick, G. Sou, M. Redon, A. J. Kreisler and A. F. Dégardin, “Fixed-gain CMOS differential amplifiers with no external feedback for a wide temperature range,” Cryogenics 49, pp. 615-619 (2009).